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Ujjval Bansal

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Microscopy Research and Technique|May 13, 2022
On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion sourceSoumita Mondal, Ujjval Bansal, Surendra Kumar Makineni
Ultramicroscopy|July 10, 2025
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materialsUjjval Bansal, Amit Sharma, Barbara Putz, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Microscopy Research and Technique|May 13, 2022
On the fabrication of atom probe tomography specimens of Al alloys at room temperature using focused ion beam milling with liquid Ga ion sourceSoumita Mondal, Ujjval Bansal, Surendra Kumar Makineni
Ultramicroscopy|July 10, 2025
Data-efficient 4D-STEM in SEM: Beyond 2D materials to metallic materialsUjjval Bansal, Amit Sharma, Barbara Putz, et al.
Pageof 1