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Ultramicroscopy|July 18, 2006
Model-based quantification of EELS spectra: Including the fine structureJ Verbeeck, S Van Aert, G Bertoni
Chemical Communications (Cambridge, England)|September 15, 2015
Low temperature deposition of 2D WS2 layers from WF6 and H2S precursors: impact of reducing agentsA Delabie, M Caymax, B Groven, et al.
Ultramicroscopy|June 3, 2020
Evaluation of different rectangular scan strategies for STEM imagingA Velazco, M Nord, A Béché, et al.
Ultramicroscopy|October 16, 2021
Reducing electron beam damage through alternative STEM scanning strategies, Part I: Experimental findingsA Velazco, A Béché, D Jannis, et al.
Ultramicroscopy|March 13, 2018
Laser-assisted atom probe tomography of semiconductors: The impact of the focused-ion beam specimen preparationJ Bogdanowicz, A Kumar, C Fleischmann, et al.
European Neuropsychopharmacology : the Journal of the European College of Neuropsychopharmacology|June 22, 2001
The prolactin response to sulpiride in major depression: the role of the D2 receptor in depressionW J Verbeeck, M Berk, J Paiker, et al.
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