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IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|September 9, 2016
Image Inpainting Through Metric Labeling via Guided Patch MixingVeepin Kumar, Jayanta Mukherjee, Shyamal Kumar Das MandalJournal of Forensic Sciences|June 5, 2026
Deep learning in image forgery: A systematic review for risk of bias (RoB)Sanjeev Kumar, Suneet K Gupta, Pushpendra Singh, et al.Pageof 1