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Vicky Philipsen

Showing results (1-10 of 4) with videos related to

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ACS Applied Materials & Interfaces|August 11, 2025
Study on Next-Generation EUV Lithography Technology: Hyper NA, the Highest Potential for Practical ImplementationInhwan Lee, Joern-Holger Franke, Vicky Philipsen, et al.
Analytical Chemistry|September 11, 2003
Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles: evaluation of a combined system for particle trace analysisNicole Erdmann, Maria Betti, Felix Kollmer, et al.
Applied Optics|January 6, 2023
Nested Sampling aided determination of tantalum optical constants in the EUV spectral rangeQais Saadeh, Philipp Naujok, Meiyi Wu, et al.
Applied Optics|March 17, 2022
Determination of optical constants of thin films in the EUVRichard Ciesielski, Qais Saadeh, Vicky Philipsen, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
ACS Applied Materials & Interfaces|August 11, 2025
Study on Next-Generation EUV Lithography Technology: Hyper NA, the Highest Potential for Practical ImplementationInhwan Lee, Joern-Holger Franke, Vicky Philipsen, et al.
Analytical Chemistry|September 11, 2003
Resonance and nonresonant laser ionization of sputtered uranium atoms from thin films and single microparticles: evaluation of a combined system for particle trace analysisNicole Erdmann, Maria Betti, Felix Kollmer, et al.
Applied Optics|January 6, 2023
Nested Sampling aided determination of tantalum optical constants in the EUV spectral rangeQais Saadeh, Philipp Naujok, Meiyi Wu, et al.
Applied Optics|March 17, 2022
Determination of optical constants of thin films in the EUVRichard Ciesielski, Qais Saadeh, Vicky Philipsen, et al.
Pageof 1