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Ultramicroscopy|August 21, 2012
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imagingAlex Zhukov, Owen Richards, Victor Ostanin, et al.
Journal of the American Chemical Society|December 6, 2012
Pipette-surface interaction: current enhancement and intrinsic forceRichard W Clarke, Alexander Zhukov, Owen Richards, et al.
Analytical Chemistry|October 7, 2017
Enhanced Quality Factor Label-free Biosensing with Micro-Cantilevers Integrated into Microfluidic SystemsTadas Kartanas, Victor Ostanin, Pavan Kumar Challa, et al.
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