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Ville Heikkinen

Showing results (1-10 of 9) with videos related to

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IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|April 20, 2018
Spectral Reflectance Estimation Using Gaussian Processes and Combination KernelsVille Heikkinen
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 11, 2013
Link functions and Matérn kernel in the estimation of reflectance spectra from RGB responsesVille Heikkinen, Arash Mirhashemi, Juha Alho
Applied Optics|April 5, 2017
Transfer standard for traceable dynamic calibration of stroboscopic scanning white light interferometerIvan Kassamakov, Anca Tureanu, Ville Heikkinen, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|July 14, 2016
Spectral imaging using consumer-level devices and kernel-based regressionVille Heikkinen, Clara Cámara, Tapani Hirvonen, et al.
Optics Express|March 14, 2013
Stroboscopic scanning white light interferometry at 2.7 MHz with 1.6 µm coherence length using a non-phosphor LED sourceVille Heikkinen, Ivan Kassamakov, Tor Paulin, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 3, 2014
Evaluating logarithmic kernel for spectral reflectance estimation-effects on model parametrization, training set size, and number of sensor spectral channelsTimo Eckhard, Eva M Valero, Javier Hernández-Andrés, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|October 3, 2008
Evaluation and unification of some methods for estimating reflectance spectra from RGB imagesVille Heikkinen, Reiner Lenz, Tuija Jetsu, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|September 4, 2007
Regularized learning framework in the estimation of reflectance spectra from camera responsesVille Heikkinen, Tuija Jetsu, Jussi Parkkinen, et al.
Sensors (Basel, Switzerland)|February 10, 2021
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelYassir Arezki, Rong Su, Ville Heikkinen, et al.
Pageof 1

Showing results (1-10 of 9) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|April 20, 2018
Spectral Reflectance Estimation Using Gaussian Processes and Combination KernelsVille Heikkinen
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|December 11, 2013
Link functions and Matérn kernel in the estimation of reflectance spectra from RGB responsesVille Heikkinen, Arash Mirhashemi, Juha Alho
Applied Optics|April 5, 2017
Transfer standard for traceable dynamic calibration of stroboscopic scanning white light interferometerIvan Kassamakov, Anca Tureanu, Ville Heikkinen, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|July 14, 2016
Spectral imaging using consumer-level devices and kernel-based regressionVille Heikkinen, Clara Cámara, Tapani Hirvonen, et al.
Optics Express|March 14, 2013
Stroboscopic scanning white light interferometry at 2.7 MHz with 1.6 µm coherence length using a non-phosphor LED sourceVille Heikkinen, Ivan Kassamakov, Tor Paulin, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 3, 2014
Evaluating logarithmic kernel for spectral reflectance estimation-effects on model parametrization, training set size, and number of sensor spectral channelsTimo Eckhard, Eva M Valero, Javier Hernández-Andrés, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|October 3, 2008
Evaluation and unification of some methods for estimating reflectance spectra from RGB imagesVille Heikkinen, Reiner Lenz, Tuija Jetsu, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|September 4, 2007
Regularized learning framework in the estimation of reflectance spectra from camera responsesVille Heikkinen, Tuija Jetsu, Jussi Parkkinen, et al.
Sensors (Basel, Switzerland)|February 10, 2021
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelYassir Arezki, Rong Su, Ville Heikkinen, et al.
Pageof 1