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Applied Optics|October 24, 2007
Polarization-based index of refraction and reflection angle estimation for remote sensing applicationsVimal Thilak, David G Voelz, Charles D Creusere
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|June 15, 2010
Passive polarimetric imagery-based material classification robust to illumination source position and viewpointThilakam Vimal Thilak Krishna, Charles D Creusere, David G Voelz
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|April 21, 2005
Signal recovery from autocorrelation and cross-correlation dataTimothy J Schulz, David G Voelz
Optics Express|November 6, 2019
Parameter-based imaging from passive multispectral polarimetric measurementsHanyu Zhan, David G Voelz, Meredith Kupinski
Optics Letters|November 28, 2019
Generating electromagnetic nonuniformly correlated beamsMilo W Hyde, Xifeng Xiao, David G Voelz
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