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Vincent S Smentkowski

Showing results (1-10 of 6) with videos related to

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The Review of Scientific Instruments|August 4, 2007
Time of flight secondary ion mass spectrometry: a powerful high throughput screening toolVincent S Smentkowski, Sara G Ostrowski
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Journal of Nanoscience and Nanotechnology|October 10, 2006
Chemomechanical nanolithography: nanografting on silicon and factors impacting linewidthMichael V Lee, Melinda Tonks Hoffman, Katherine Barnett, et al.
Journal of the American Chemical Society|July 12, 2007
Direct adsorption and detection of proteins, including ferritin, onto microlens array patterned bioarraysFeng Zhang, Richard J Gates, Vincent S Smentkowski, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|October 4, 2019
Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurementsDonald R Baer, Kateryna Artyushkova, C Richard Brundle, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 18, 2020
Proliferation of Faulty Materials Data Analysis in the LiteratureMatthew R Linford, Vincent S Smentkowski, John T Grant, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
The Review of Scientific Instruments|August 4, 2007
Time of flight secondary ion mass spectrometry: a powerful high throughput screening toolVincent S Smentkowski, Sara G Ostrowski
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|May 24, 2011
Atomic-scale phase composition through multivariate statistical analysis of atom probe tomography dataMichael R Keenan, Vincent S Smentkowski, Robert M Ulfig, et al.
Journal of Nanoscience and Nanotechnology|October 10, 2006
Chemomechanical nanolithography: nanografting on silicon and factors impacting linewidthMichael V Lee, Melinda Tonks Hoffman, Katherine Barnett, et al.
Journal of the American Chemical Society|July 12, 2007
Direct adsorption and detection of proteins, including ferritin, onto microlens array patterned bioarraysFeng Zhang, Richard J Gates, Vincent S Smentkowski, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society|October 4, 2019
Practical Guides for X-Ray Photoelectron Spectroscopy (XPS): First Steps in planning, conducting and reporting XPS measurementsDonald R Baer, Kateryna Artyushkova, C Richard Brundle, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 18, 2020
Proliferation of Faulty Materials Data Analysis in the LiteratureMatthew R Linford, Vincent S Smentkowski, John T Grant, et al.
Pageof 1