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Optics Express|July 8, 2009
193nm Superlens imaging structure for 20nm lithography nodeZhong Shi, Vladimir Kochergin, Fei WangOptics Express|December 10, 2009
Depth-of-focus (DoF) analysis of a 193nm superlens imaging structureZhong Shi, Vladimir Kochergin, Fei WangApplied Optics|May 14, 2015
Radiation stability of visible and near-infrared optical and magneto-optical properties of terbium gallium garnet crystalsBrian Geist, Reginald Ronningen, Andreas Stolz, et al.Pageof 1