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Vladimir M Kaganer

Showing results (1-10 of 15) with videos related to

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Journal of Applied Crystallography|April 10, 2024
X-ray diffraction from dislocation half-loops in epitaxial filmsVladimir M Kaganer
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
X-ray diffraction peaks from correlated dislocations: Monte Carlo study of dislocation screeningVladimir M Kaganer, Karl K Sabelfeld
Acta Crystallographica. Section A, Foundations and Advances|September 2, 2014
Strain distributions and diffraction peak profiles from crystals with dislocationsVladimir M Kaganer, Karl K Sabelfeld
Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus siliconVladimir M Kaganer, Ilia Petrov, Liubov Samoylova
Acta Crystallographica. Section A, Foundations and Advances|January 8, 2020
X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulsesVladimir M Kaganer, Ilia Petrov, Liubov Samoylova
Nanotechnology|March 11, 2016
Piezoelectric potential in axial (In,Ga)N/GaN nanowire heterostructuresVladimir M Kaganer, Oliver Marquardt, Oliver Brandt
Acta Crystallographica. Section A, Foundations and Advances|January 5, 2021
Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's lawVladimir M Kaganer, Oleg V Konovalov, Sergio Fernández-Garrido
Nanoscale Research Letters|March 31, 2012
Delayed crystallization of ultrathin Gd2O3 layers on Si(111) observed by in situ X-ray diffractionMichael Hanke, Vladimir M Kaganer, Oliver Bierwagen, et al.
Physical Review Letters|March 5, 2009
Kinetic optimum of volmer-weber growthVladimir M Kaganer, Bernd Jenichen, Roman Shayduk, et al.
Nano Letters|September 5, 2013
Strain engineering of nanowire multi-quantum well demonstrated by Raman spectroscopyMartin Wölz, Manfred Ramsteiner, Vladimir M Kaganer, et al.
Pageof 2

Showing results (1-10 of 15) with videos related to

Sort By:
Pageof 2
Journal of Applied Crystallography|April 10, 2024
X-ray diffraction from dislocation half-loops in epitaxial filmsVladimir M Kaganer
Acta Crystallographica. Section A, Foundations of Crystallography|October 22, 2010
X-ray diffraction peaks from correlated dislocations: Monte Carlo study of dislocation screeningVladimir M Kaganer, Karl K Sabelfeld
Acta Crystallographica. Section A, Foundations and Advances|September 2, 2014
Strain distributions and diffraction peak profiles from crystals with dislocationsVladimir M Kaganer, Karl K Sabelfeld
Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Resolution of a bent-crystal spectrometer for X-ray free-electron laser pulses: diamond versus siliconVladimir M Kaganer, Ilia Petrov, Liubov Samoylova
Acta Crystallographica. Section A, Foundations and Advances|January 8, 2020
X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulsesVladimir M Kaganer, Ilia Petrov, Liubov Samoylova
Nanotechnology|March 11, 2016
Piezoelectric potential in axial (In,Ga)N/GaN nanowire heterostructuresVladimir M Kaganer, Oliver Marquardt, Oliver Brandt
Acta Crystallographica. Section A, Foundations and Advances|January 5, 2021
Small-angle X-ray scattering from GaN nanowires on Si(111): facet truncation rods, facet roughness and Porod's lawVladimir M Kaganer, Oleg V Konovalov, Sergio Fernández-Garrido
Nanoscale Research Letters|March 31, 2012
Delayed crystallization of ultrathin Gd2O3 layers on Si(111) observed by in situ X-ray diffractionMichael Hanke, Vladimir M Kaganer, Oliver Bierwagen, et al.
Physical Review Letters|March 5, 2009
Kinetic optimum of volmer-weber growthVladimir M Kaganer, Bernd Jenichen, Roman Shayduk, et al.
Nano Letters|September 5, 2013
Strain engineering of nanowire multi-quantum well demonstrated by Raman spectroscopyMartin Wölz, Manfred Ramsteiner, Vladimir M Kaganer, et al.
Pageof 2