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Nanomaterials (Basel, Switzerland)|February 21, 2020
Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector CalibrationRadim Skoupy, Tomas Fort, Vladislav KrzyzanekJournal of Microscopy|October 4, 2007
Bundles of hexagonally arranged tubules in timothy grass pollen: detection of a novel pollen component using anhydrous fixation and image analysis techniques in transmission electron microscopyMonika Grote, Vladislav Krzyzanek, Rudolf ReicheltMaterials (Basel, Switzerland)|December 24, 2021
High Resolution Powder Electron Diffraction in Scanning Electron MicroscopyMiroslav Slouf, Radim Skoupy, Ewa Pavlova, et al.Journal of Applied Crystallography|June 3, 2026
Computational methods for automated center determination in electron diffraction patternsPavlina Sikorova, Miroslav Slouf, Tomas Molnar, et al.Micron (Oxford, England : 1993)|May 2, 2018
The innovation of cryo-SEM freeze-fracturing methodology demonstrated on high pressure frozen biofilmKamila Hrubanova, Jana Nebesarova, Filip Ruzicka, et al.Nanomaterials (Basel, Switzerland)|April 30, 2021
Powder Nano-Beam Diffraction in Scanning Electron Microscope: Fast and Simple Method for Analysis of Nanoparticle Crystal StructureMiroslav Slouf, Radim Skoupy, Ewa Pavlova, et al.Ultramicroscopy|April 7, 2019
Quantitative STEM imaging of electron beam induced mass loss of epoxy resin sectionsRadim Skoupy, Jana Nebesarova, Miroslav Slouf, et al.Sensors (Basel, Switzerland)|November 25, 2018
Monitoring <i>Candida parapsilosis</i> and <i>Staphylococcus epidermidis</i> Biofilms by a Combination of Scanning Electron Microscopy and Raman SpectroscopyKamila Hrubanova, Vladislav Krzyzanek, Jana Nebesarova, et al.Biophysical Journal|February 25, 2016
A Versatile High-Vacuum Cryo-transfer System for Cryo-microscopy and AnalyticsSebastian Tacke, Vladislav Krzyzanek, Harald Nüsse, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 11, 2025
4D-STEM-in-SEM: Changing an SEM Microscope to a User-friendly Powder Electron DiffractometerMiroslav Slouf, Pavlina Sikorova, Ewa Pavlova, et al.Pageof 4