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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 25, 2025
Rapid-Acquisition Fluctuation Electron Microscopy: Decoherence and the Dominant Role of NoiseArmin Zjajo, Hongchu Du, Rafal E Dunin-Borkowski, et al.Ultramicroscopy|September 14, 2024
Clustering characteristic diffraction vectors in 4-D STEM data sets from overlapping structures in nanocrystalline and amorphous materialsCarter Francis, Paul M VoylesBMC Pregnancy and Childbirth|April 18, 2015
Exploration of perceptions and decision-making processes related to childbirth in rural Sierra LeoneLaura Treacy, Mette SagbakkenMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 5, 2011
Z dependence of electron scattering by single atoms into annular dark-field detectorsMichael M J TreacyUltramicroscopy|August 26, 2006
When structural noise is the signal: speckle statistics in fluctuation electron microscopyM M J TreacyJMIR Dermatology|January 17, 2024
Hyaluronidase for Dermal Filler Complications: Review of Applications and Dosage RecommendationsGeorge Kroumpouzos, Patrick TreacySurgical Endoscopy|March 1, 1994
Unrecognized hazards of surgical electrodes passed through metal suction-irrigation devicesC R Voyles, R D TuckerUltramicroscopy|December 25, 2007
A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous compositeW G Stratton, P M VoylesPageof 2,846