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TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik|December 1, 2018
Hybrid durum wheat: heterosis of grain yield and quality traits and genetic architecture of anther extrusionWessam Akel, Matthias Rapp, Patrick Thorwarth, et al.BMC Genetics|March 14, 2012
Association of single nucleotide polymorphic sites in candidate genes with aggressiveness and deoxynivalenol production in Fusarium graminearum causing wheat head blightFiras Talas, Tobias Würschum, Jochen C Reif, et al.The Plant Cell|March 16, 2010
MGOUN1 encodes an Arabidopsis type IB DNA topoisomerase required in stem cell regulation and to maintain developmentally regulated gene silencingPhilipp Graf, Alicja Dolzblasz, Tobias Würschum, et al.TAG. Theoretical and Applied Genetics. Theoretische Und Angewandte Genetik|August 22, 2018
Assessing the variation and genetic architecture of asparagine content in wheat: What can plant breeding contribute to a reduction in the acrylamide precursor?Matthias Rapp, Klaus Schwadorf, Willmar L Leiser, et al.Physical Chemistry Chemical Physics : PCCP|June 29, 2021
Nanoporous gold electrodes modified with self-assembled monolayers for electrochemical control of the surface chargeElisabeth Hengge, Markus Hirber, Philipp Brunner, et al.Langmuir : the ACS Journal of Surfaces and Colloids|July 14, 2016
Electrochemically Tunable Resistance of Nanoporous Platinum Produced by DealloyingEva-Maria Steyskal, Zhen Qi, Peter Pölt, et al.Small (Weinheim an Der Bergstrasse, Germany)|October 2, 2019
Magneto-Ionic Switching of SuperparamagnetismMarkus Gößler, Mihaela Albu, Gregor Klinser, et al.BMC Genetics|July 31, 2019
Copy number variation of Ppd-B1 is the major determinant of heading time in durum wheatTobias Würschum, Matthias Rapp, Thomas Miedaner, et al.Science (New York, N.Y.)|April 12, 2003
Charge-induced reversible strain in a metalJ Weissmüller, R N Viswanath, D Kramer, et al.Plants (Basel, Switzerland)|September 3, 2020
Genetic Architecture of Cereal Leaf Beetle Resistance in WheatTobias Würschum, Willmar L Leiser, Simon M Langer, et al.Pageof 15