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Ultramicroscopy|January 11, 2011
Effect of analysis direction on the measurement of interfacial mixing in thin metal layers with atom probe tomographyD J Larson, T J Prosa, B P Geiser, et al.
Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|October 26, 2005
Transmission measurements in wedge-shaped absorbing samples: an experiment for observing negative refractionM Sanz, A C Papageorgopoulos, W F Egelhoff, et al.
Physical Review Letters|January 7, 2003
Universal scaling of ballistic magnetoresistance in magnetic nanocontactsS H Chung, M Muñoz, N García, et al.
Ultramicroscopy|June 17, 2008
In situ TEM studies of local transport and structure in nanoscale multilayer filmsA N Chiaramonti, L J Thompson, W F Egelhoff, et al.
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