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Applied Optics|September 24, 2010
Laser retroreflectance consistent with a polarized single-scatter weak electromagnetic-field localization-interference phenomenonW G EganApplied Optics|April 15, 2010
Volumetric scattering and absorption by aerosols: parametric sensitivity in Mie modeling and comparisons to observationsW G EganApplied Optics|February 23, 2010
Retroreflectance measurements of photometric standards and coatings. Part 2W G Egan, T HilgemanApplied Optics|February 23, 2010
Spectral reflectance of particulate materials: a Monte Carlo model including asperity scatteringW G Egan, T HilgemanApplied Optics|January 30, 2010
Optical Properties of Naturally Occurring Rhodochrosite Between 0.33 microm and 25 micromW G Egan, T HilgemanApplied Optics|February 19, 2010
Retroreflectance measurements of photometric standards and coatingsW G Egan, T HilgemanApplied Optics|October 22, 2010
Polarimetric detection of land sediment runoff into the ocean using space shuttle imageryW G Egan, M SidranApplied Optics|February 16, 2010
Integrating Spheres for Measurements Between 0.185 microm and 12 micromW G Egan, T HilgemanApplied Optics|January 12, 2010
Lambert scattering from a cone and paraboloid of revolutionF A Spagnolo, K W BrandPageof 2