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W R Ashurst

Showing results (1-10 of 6) with videos related to

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Langmuir : the ACS Journal of Surfaces and Colloids|July 25, 2009
Interfacial water structure on a highly hydroxylated silica filmA Anderson, W R Ashurst
Langmuir : the ACS Journal of Surfaces and Colloids|August 7, 2009
Enabling organosilicon chemistries on inert polymer surfaces with a vapor-deposited silica layerA Anderson, W R Ashurst
Optics Letters|January 26, 2011
Experimental requirement of the error-compensating five-frame interferogram-collecting sequence used in phase-shifting interferometryN Ansari, W R Ashurst
Nanotechnology|May 8, 2009
A gas-expanded liquid nanoparticle deposition technique for reducing the adhesion of silicon microstructuresK M Hurst, C B Roberts, W R Ashurst
Journal of the American Chemical Society|July 18, 2001
Formation of alkanethiol monolayer on Ge(111)S M Han, W R Ashurst, C Carraro, et al.
The Review of Scientific Instruments|August 2, 2013
Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometryE Soylemez, R A Plass, W R Ashurst, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Langmuir : the ACS Journal of Surfaces and Colloids|July 25, 2009
Interfacial water structure on a highly hydroxylated silica filmA Anderson, W R Ashurst
Langmuir : the ACS Journal of Surfaces and Colloids|August 7, 2009
Enabling organosilicon chemistries on inert polymer surfaces with a vapor-deposited silica layerA Anderson, W R Ashurst
Optics Letters|January 26, 2011
Experimental requirement of the error-compensating five-frame interferogram-collecting sequence used in phase-shifting interferometryN Ansari, W R Ashurst
Nanotechnology|May 8, 2009
A gas-expanded liquid nanoparticle deposition technique for reducing the adhesion of silicon microstructuresK M Hurst, C B Roberts, W R Ashurst
Journal of the American Chemical Society|July 18, 2001
Formation of alkanethiol monolayer on Ge(111)S M Han, W R Ashurst, C Carraro, et al.
The Review of Scientific Instruments|August 2, 2013
Probing microelectromechanical systems in an environmentally controlled chamber using long working distance interferometryE Soylemez, R A Plass, W R Ashurst, et al.
Pageof 1