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W R Hunter

Showing results (31-40 of 60) with videos related to

Pageof 6
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Applied Optics|January 16, 2010
Reflectance of semitransparent platinum films on various substrates in the vacuum ultravioletG Hass, J B Ramsey, W R Hunter
Applied Optics|March 24, 2010
Multiplate resonant reflectors for the vacuum ultravioletW R Hunter, M H Hutchinson, M R Jones
Applied Optics|February 4, 2010
Optical grating evaluator: a device for detailed measurement of diffraction grating efficiencies in the vacuum ultravioletD J Michels, T L Mikes, W R Hunter
Applied Optics|November 12, 2010
Transmittance of a thin Saran film in the 45-584-Å wavelength regionJ F Seely, W R Hunter, M P Kowalski
Applied Optics|February 4, 2010
Evaluation of Pinholes in Unbacked Metal Film Filters to be Used in Rocket- and Satellite-Borne XUV SpectroheliographsW R Hunter, J D Purcell, G N Steele
Applied Optics|February 4, 2010
Increase in Transmittance of Unbacked Aluminum Filters Exposed to rf or dc Discharges in OxygenW R Hunter, G N Steele, R B Gillette
Applied Optics|March 18, 2010
Effect of UV irradiation on evaporated ZnS filmsG Hass, J B Heaney, W R Hunter, et al.
Applied Optics|November 25, 2010
Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidencesJ F Seely, M P Kowalski, W R Hunter, et al.
Applied Optics|February 2, 2010
Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of HydrogenE T Hutcheson, J T Cox, G Hass, et al.
Applied Optics|August 31, 2010
Optical constants of thin silicon films near the silicon L(2,3) absorption edgeJ F Seely, W R Hunter, J C Rife, et al.
Pageof 6

Showing results (31-40 of 60) with videos related to

Sort By:
Pageof 6
Applied Optics|January 16, 2010
Reflectance of semitransparent platinum films on various substrates in the vacuum ultravioletG Hass, J B Ramsey, W R Hunter
Applied Optics|March 24, 2010
Multiplate resonant reflectors for the vacuum ultravioletW R Hunter, M H Hutchinson, M R Jones
Applied Optics|February 4, 2010
Optical grating evaluator: a device for detailed measurement of diffraction grating efficiencies in the vacuum ultravioletD J Michels, T L Mikes, W R Hunter
Applied Optics|November 12, 2010
Transmittance of a thin Saran film in the 45-584-Å wavelength regionJ F Seely, W R Hunter, M P Kowalski
Applied Optics|February 4, 2010
Evaluation of Pinholes in Unbacked Metal Film Filters to be Used in Rocket- and Satellite-Borne XUV SpectroheliographsW R Hunter, J D Purcell, G N Steele
Applied Optics|February 4, 2010
Increase in Transmittance of Unbacked Aluminum Filters Exposed to rf or dc Discharges in OxygenW R Hunter, G N Steele, R B Gillette
Applied Optics|March 18, 2010
Effect of UV irradiation on evaporated ZnS filmsG Hass, J B Heaney, W R Hunter, et al.
Applied Optics|November 25, 2010
Reflectance of a wideband multilayer x-ray mirror at normal and grazing incidencesJ F Seely, M P Kowalski, W R Hunter, et al.
Applied Optics|February 2, 2010
Monitoring the Thickness of Thin MgF(2) and LiF Films on Al by Reflectance Measurements Using the 1216-A Line of HydrogenE T Hutcheson, J T Cox, G Hass, et al.
Applied Optics|August 31, 2010
Optical constants of thin silicon films near the silicon L(2,3) absorption edgeJ F Seely, W R Hunter, J C Rife, et al.
Pageof 6