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Journal of X-Ray Science and Technology|February 11, 2011
Characterization of a Flat-Field Grazing-Incidence XUV SpectrometerW Schwanda, K Eidmann, M C RichardsonJournal of X-Ray Science and Technology|February 11, 2011
Influence of exposure time on the sensitivity of kodak 101 x-ray filmH Nishimura, K Eidmann, K Sugimoto, et al.Pageof 1