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Ultramicroscopy|March 30, 2004
The effect of inelastic scattering on crystal structure refinement from electron diffraction patterns recorded under almost parallel illuminationJ Jansen, H W Zandbergen, M T OttenUltramicroscopy|April 20, 2001
Determination of the orientation in small areas of the exit waveR M Bokel, J Jansen, H W ZandbergenUltramicroscopy|March 20, 2018
Towards optimization of experimental parameters for studying Li-O2 battery discharge products in TEM using in situ EELSShibabrata Basak, Jacob Jansen, Yoones Kabiri, et al.Physical Review Letters|March 16, 2007
Dislocation injection, reconstruction, and atomic transport on {001} Au terracesHenny W Zandbergen, Chun-Wei Pao, David J SrolovitzUltramicroscopy|March 30, 2004
Atomic imaging in aberration-corrected high-resolution transmission electron microscopyJ H Chen, H W Zandbergen, D Van DyckActa Crystallographica. Section D, Biological Crystallography|July 1, 2009
Unit-cell determination from randomly oriented electron-diffraction patternsLinhua Jiang, Dilyana Georgieva, Henny W Zandbergen, et al.ACS Nano|April 14, 2015
Controlling defects in graphene for optimizing the electrical properties of graphene nanodevicesLeonardo Vicarelli, Stephanie J Heerema, Cees Dekker, et al.Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics|August 11, 2005
Translocation of double-strand DNA through a silicon oxide nanoporeA J Storm, J H Chen, H W Zandbergen, et al.ACS Nano|January 27, 2010
Energetics of polar and nonpolar facets of PbSe nanocrystals from theory and experimentChangming Fang, Marijn A van Huis, Daniël Vanmaekelbergh, et al.Data in Brief|March 10, 2016
Data analysis and other considerations concerning the study of precipitation in Al-Mg-Si alloys by Atom Probe TomographyM W Zandbergen, Q Xu, A Cerezo, et al.Pageof 9