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William Leeb

Showing results (1-10 of 3) with videos related to

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Inverse Problems|February 28, 2025
Multi-target detection with application to cryo-electron microscopyTamir Bendory, Nicolas Boumal, William Leeb, et al.
Information and Inference : a Journal of the IMA|August 15, 2022
Super-resolution multi-reference alignmentTamir Bendory, Ariel Jaffe, William Leeb, et al.
SIAM Journal on Imaging Sciences|August 15, 2024
Toward Single Particle Reconstruction without Particle Picking: Breaking the Detection LimitTamir Bendory, Nicolas Boumal, William Leeb, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Inverse Problems|February 28, 2025
Multi-target detection with application to cryo-electron microscopyTamir Bendory, Nicolas Boumal, William Leeb, et al.
Information and Inference : a Journal of the IMA|August 15, 2022
Super-resolution multi-reference alignmentTamir Bendory, Ariel Jaffe, William Leeb, et al.
SIAM Journal on Imaging Sciences|August 15, 2024
Toward Single Particle Reconstruction without Particle Picking: Breaking the Detection LimitTamir Bendory, Nicolas Boumal, William Leeb, et al.
Pageof 1