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Wojciech Chojnacki

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Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 16, 2019
Determining ellipses from low-resolution images with a comprehensive image formation modelWojciech Chojnacki, Zygmunt L Szpak
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 21, 2004
From FNS to HEIV: a link between two vision parameter estimation methodsWojciech Chojnacki, Michael J Brooks, Anton van den Hengel, et al.
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Showing results (1-10 of 2) with videos related to

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Pageof 1
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|March 16, 2019
Determining ellipses from low-resolution images with a comprehensive image formation modelWojciech Chojnacki, Zygmunt L Szpak
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 21, 2004
From FNS to HEIV: a link between two vision parameter estimation methodsWojciech Chojnacki, Michael J Brooks, Anton van den Hengel, et al.
Pageof 1