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Nanoscale
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September 19, 2018
Optimized single-layer MoS
HyunJeong Kim, WungYeon Kim, Maria O'Brien, et al.
Nanotechnology
|
March 8, 2018
Soft-type trap-induced degradation of MoS<sub>2</sub> field effect transistors
Young-Hoon Cho, Min-Yeul Ryu, Kook Jin Lee, et al.
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Search research articles
Search
Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Nanoscale
|
September 19, 2018
Optimized single-layer MoS
HyunJeong Kim, WungYeon Kim, Maria O'Brien, et al.
Nanotechnology
|
March 8, 2018
Soft-type trap-induced degradation of MoS<sub>2</sub> field effect transistors
Young-Hoon Cho, Min-Yeul Ryu, Kook Jin Lee, et al.
Page
of 1