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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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Xavier Llovet

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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 27, 2016

Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray LinesXavier Llovet, Philippe T Pinard, Erkki Heikinheimo, et al.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018

Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2020

Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral InclusionsXavier Llovet, Joaquín A Proenza, Núria Pujol-Solà, et al.

Scientific Reports|May 16, 2023

A track record of Au-Ag nanomelt generation during fluid-mineral interactionsDiego Domínguez-Carretero, José María González-Jiménez, Joaquín A Proenza, et al.

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Search research articles

Showing results (11-20 of 14) with videos related to

Sort By:

Pageof 2

You have reached the last page of results.This site can display upto 14 results.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|October 27, 2016

Electron Probe Microanalysis of Ni Silicides Using Ni-L X-Ray LinesXavier Llovet, Philippe T Pinard, Erkki Heikinheimo, et al.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 4, 2018

Secondary Fluorescence in WDS: The Role of Spectrometer PositioningBen Buse, Jon Wade, Xavier Llovet, et al.

Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 4, 2020

Correction of Secondary Fluorescence Across Phase Boundaries in Electron Probe Microanalysis of Mineral InclusionsXavier Llovet, Joaquín A Proenza, Núria Pujol-Solà, et al.

Scientific Reports|May 16, 2023

A track record of Au-Ag nanomelt generation during fluid-mineral interactionsDiego Domínguez-Carretero, José María González-Jiménez, Joaquín A Proenza, et al.

Pageof 2