Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Ximing Ren

Showing results (11-20 of 15) with videos related to

Pageof 2
Sort By:
You have reached the last page of results.This site can display upto 15 results.
Optics Express|October 10, 2013
Kilometer-range depth imaging at 1,550 nm wavelength using an InGaAs/InP single-photon avalanche diode detectorAongus McCarthy, Ximing Ren, Adriano Della Frera, et al.
Optics Express|April 11, 2013
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detectionAongus McCarthy, Nils J Krichel, Nathan R Gemmell, et al.
Optics Express|February 3, 2016
Fill-factor improvement of Si CMOS single-photon avalanche diode detector arrays by integration of diffractive microlens arraysGiuseppe Intermite, Aongus McCarthy, Ryan E Warburton, et al.
Optics Express|May 14, 2015
Metasurface for characterization of the polarization state of lightDandan Wen, Fuyong Yue, Santosh Kumar, et al.
Applied Optics|May 14, 2020
High concentration factor diffractive microlenses integrated with CMOS single-photon avalanche diode detector arrays for fill-factor improvementPeter W R Connolly, Ximing Ren, Aongus McCarthy, et al.
Pageof 2

Showing results (11-20 of 15) with videos related to

Sort By:
Pageof 2
You have reached the last page of results.This site can display upto 15 results.
Optics Express|October 10, 2013
Kilometer-range depth imaging at 1,550 nm wavelength using an InGaAs/InP single-photon avalanche diode detectorAongus McCarthy, Ximing Ren, Adriano Della Frera, et al.
Optics Express|April 11, 2013
Kilometer-range, high resolution depth imaging via 1560 nm wavelength single-photon detectionAongus McCarthy, Nils J Krichel, Nathan R Gemmell, et al.
Optics Express|February 3, 2016
Fill-factor improvement of Si CMOS single-photon avalanche diode detector arrays by integration of diffractive microlens arraysGiuseppe Intermite, Aongus McCarthy, Ryan E Warburton, et al.
Optics Express|May 14, 2015
Metasurface for characterization of the polarization state of lightDandan Wen, Fuyong Yue, Santosh Kumar, et al.
Applied Optics|May 14, 2020
High concentration factor diffractive microlenses integrated with CMOS single-photon avalanche diode detector arrays for fill-factor improvementPeter W R Connolly, Ximing Ren, Aongus McCarthy, et al.
Pageof 2