Showing results (31-40 of 77) with videos related to
Sort By:
Pageof 8
Frontiers in Plant Science|November 3, 2018
Genetic Mapping of Resistance in Hexaploid Wheat for a Quarantine Disease: Karnal BuntGurcharn S Brar, Guillermo Fuentes-Dávila, Xinyao He, et al.Plant Disease|June 9, 2020
Development of an Evaluation System for Fusarium Resistance in Wheat Grains and Its Application in Assessment of the Corresponding Effects of Fhb1Xuan Gong, Xinyao He, Yuhui Zhang, et al.Frontiers in Plant Science|March 22, 2021
Dissecting Quantitative Trait Loci for Spot Blotch Resistance in South Asia Using Two Wheat Recombinant Inbred Line PopulationsChandan Roy, Navin C Gahtyari, Xinyao He, et al.Plos One|June 29, 2016
QTL Characterization of Fusarium Head Blight Resistance in CIMMYT Bread Wheat Line Soru#1Xinyao He, Morten Lillemo, Jianrong Shi, et al.BMC Plant Biology|April 25, 2019
Investigation and genome-wide association study for Fusarium crown rot resistance in Chinese common wheatXia Yang, Yubo Pan, Pawan K Singh, et al.Journal of Endodontics|February 28, 2015
Extracellular Signal-regulated Kinase Mitogen-activated Protein Kinase and Phosphatidylinositol 3-Kinase/Akt Signaling Are Required for Lipopolysaccharide-mediated Mineralization in Murine Odontoblast-like CellsZhihua Wang, Fengle Ma, Juan Wang, et al.Scientific Reports|January 19, 2017
IFN-γ regulates human dental pulp stem cells behavior via NF-κB and MAPK signalingXinyao He, Wenkai Jiang, Zhirong Luo, et al.Heredity|December 9, 2021
Genetic dissection for head blast resistance in wheat using two mapping populationsXinyao He, Muhammad Rezaul Kabir, Krishna K Roy, et al.Plos One|June 11, 2026
Field screening and genetic mapping of wheat blast resistance for a panel of common wheat from BangladeshMd Farhad, Xinyao He, Hirokazu Handa, et al.Frontiers in Plant Science|October 26, 2023
Assessment of Indian wheat germplasm for Septoria nodorum blotch and tan spot reveals new QTLs conferring resistance along with recessive alleles of Tsn1 and Snn3Sudhir Navathe, Xinyao He, Umesh Kamble, et al.Pageof 8