Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Xiuguo Chen

Showing results (31-40 of 47) with videos related to

Pageof 5
Sort By:
Optics Express|February 14, 2023
Monitoring sidewall tilting of pixelated nanogratings in 3D displayChao Chen, Xiuguo Chen, Sheng Sheng, et al.
Photoacoustics|January 13, 2025
Temperature dependence of femtosecond photoacoustic process in high-precision characterization for metal nanofilmsZhongyu Wang, Jing Min, Yong Sun, et al.
The Review of Scientific Instruments|June 3, 2016
Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrologyXiuguo Chen, Weichao Du, Kui Yuan, et al.
Nanoscale|March 13, 2026
Outstanding field emission performance <i>via</i> superior carbon nanotubes dispersion by acoustic resonance mixing and synergistic function-oriented annealing strategyWeiwei Yu, Ziqin Ai, Zhe Liu, et al.
Optics Express|February 1, 2024
Frequency properties of channeled spectropolarimetry: an information theory perspectiveJing Hu, Xiuguo Chen, Wenlong Chen, et al.
Sensors (Basel, Switzerland)|February 2, 2018
A Liquid-Surface-Based Three-Axis Inclination Sensor for Measurement of Stage Tilt MotionsYuki Shimizu, Satoshi Kataoka, Tatsuya Ishikawa, et al.
The Journal of Physical Chemistry Letters|September 7, 2019
Complex Optical Conductivity of Two-Dimensional MoS<sub>2</sub>: A Striking Layer DependencyBaokun Song, Honggang Gu, Mingsheng Fang, et al.
Optics Express|September 13, 2019
Simulation method for study on outcoupling characteristics of stratified anisotropic OLEDsXianhua Ke, Honggang Gu, Xuenan Zhao, et al.
Applied Optics|April 1, 2020
Multiobjective optimization for target design in diffraction-based overlay metrologyYating Shi, Kuangyi Li, Xiuguo Chen, et al.
Nanoscale|September 5, 2019
Layer-dependent dielectric and optical properties of centimeter-scale 2D WSe<sub>2</sub>: evolution from a single layer to few layersHonggang Gu, Baokun Song, Mingsheng Fang, et al.
Pageof 5

Showing results (31-40 of 47) with videos related to

Sort By:
Pageof 5
Optics Express|February 14, 2023
Monitoring sidewall tilting of pixelated nanogratings in 3D displayChao Chen, Xiuguo Chen, Sheng Sheng, et al.
Photoacoustics|January 13, 2025
Temperature dependence of femtosecond photoacoustic process in high-precision characterization for metal nanofilmsZhongyu Wang, Jing Min, Yong Sun, et al.
The Review of Scientific Instruments|June 3, 2016
Development of a spectroscopic Mueller matrix imaging ellipsometer for nanostructure metrologyXiuguo Chen, Weichao Du, Kui Yuan, et al.
Nanoscale|March 13, 2026
Outstanding field emission performance <i>via</i> superior carbon nanotubes dispersion by acoustic resonance mixing and synergistic function-oriented annealing strategyWeiwei Yu, Ziqin Ai, Zhe Liu, et al.
Optics Express|February 1, 2024
Frequency properties of channeled spectropolarimetry: an information theory perspectiveJing Hu, Xiuguo Chen, Wenlong Chen, et al.
Sensors (Basel, Switzerland)|February 2, 2018
A Liquid-Surface-Based Three-Axis Inclination Sensor for Measurement of Stage Tilt MotionsYuki Shimizu, Satoshi Kataoka, Tatsuya Ishikawa, et al.
The Journal of Physical Chemistry Letters|September 7, 2019
Complex Optical Conductivity of Two-Dimensional MoS<sub>2</sub>: A Striking Layer DependencyBaokun Song, Honggang Gu, Mingsheng Fang, et al.
Optics Express|September 13, 2019
Simulation method for study on outcoupling characteristics of stratified anisotropic OLEDsXianhua Ke, Honggang Gu, Xuenan Zhao, et al.
Applied Optics|April 1, 2020
Multiobjective optimization for target design in diffraction-based overlay metrologyYating Shi, Kuangyi Li, Xiuguo Chen, et al.
Nanoscale|September 5, 2019
Layer-dependent dielectric and optical properties of centimeter-scale 2D WSe<sub>2</sub>: evolution from a single layer to few layersHonggang Gu, Baokun Song, Mingsheng Fang, et al.
Pageof 5