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Xuechao Sha

Showing results (1-10 of 5) with videos related to

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Nano Letters|July 18, 2017
Plastic Deformation through Dislocation Saturation in Ultrasmall Pt Nanocrystals and Its in Situ Atomistic MechanismsLihua Wang, Jiao Teng, Xuechao Sha, et al.
Materials (Basel, Switzerland)|July 11, 2018
Modification of Eutectic Si in Al-Si-(Ba) Alloy by Inducing a Novel 9R Structure in TwinsXuechao Sha, Xuefei Chen, Huiyan Ning, et al.
Ultramicroscopy|September 9, 2018
In situ atomic scale mechanisms of strain-induced twin boundary shear to high angle grain boundary in nanocrystalline PtLihua Wang, Jiao Teng, Yu Wu, et al.
Scientific Reports|October 18, 2017
Size effect on the deformation mechanisms of nanocrystalline platinum thin filmsXinyu Shu, Deli Kong, Yan Lu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 24, 2017
A Second Amorphous Layer Underneath Surface OxideBin Zhang, Kunlin Peng, Xuechao Sha, et al.
Pageof 1

Showing results (1-10 of 5) with videos related to

Sort By:
Pageof 1
Nano Letters|July 18, 2017
Plastic Deformation through Dislocation Saturation in Ultrasmall Pt Nanocrystals and Its in Situ Atomistic MechanismsLihua Wang, Jiao Teng, Xuechao Sha, et al.
Materials (Basel, Switzerland)|July 11, 2018
Modification of Eutectic Si in Al-Si-(Ba) Alloy by Inducing a Novel 9R Structure in TwinsXuechao Sha, Xuefei Chen, Huiyan Ning, et al.
Ultramicroscopy|September 9, 2018
In situ atomic scale mechanisms of strain-induced twin boundary shear to high angle grain boundary in nanocrystalline PtLihua Wang, Jiao Teng, Yu Wu, et al.
Scientific Reports|October 18, 2017
Size effect on the deformation mechanisms of nanocrystalline platinum thin filmsXinyu Shu, Deli Kong, Yan Lu, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|February 24, 2017
A Second Amorphous Layer Underneath Surface OxideBin Zhang, Kunlin Peng, Xuechao Sha, et al.
Pageof 1