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Materials (Basel, Switzerland)|August 10, 2024
A Review of an Investigation of the Ultrafast Laser Processing of Brittle and Hard MaterialsJiecai Feng, Junzhe Wang, Hongfei Liu, et al.Proceedings of the National Academy of Sciences of the United States of America|November 22, 2017
Dynamics and control of gold-encapped gallium arsenide nanowires imaged by 4D electron microscopyBin Chen, Xuewen Fu, Jau Tang, et al.Advanced Materials (Deerfield Beach, Fla.)|June 2, 2026
A Library of Dipolar Skyrmion Bags Observed in a Centrosymmetric van der Waals MagnetYue Hu, Donghai Yang, Xuange Hu, et al.ACS Nano|March 27, 2025
Femtosecond Laser Manipulation of Multistage Phase Switching in Two-Dimensional In2Se3 Visualized via an In Situ Transmission Electron MicroscopeJunqing Guo, Lifu Zhang, Meiling Zhang, et al.Scientific Reports|October 28, 2017
Determining the Quality Factor of Dielectric Ceramic Mixtures with Dielectric Constants in the Microwave Frequency RangeHetuo Chen, Xuewen Fu, Qi An, et al.Advanced Science (Weinheim, Baden-Wurttemberg, Germany)|June 19, 2024
A Femtosecond Electron-Based Versatile Microscopy for Visualizing Carrier Dynamics in Semiconductors Across Spatiotemporal and Energetic DomainsYaqing Zhang, Xiang Chen, Yaocheng Yu, et al.Iscience|November 29, 2023
Directly seeding epitaxial growth of tungsten oxides/tungsten diselenide mixed-dimensional heterostructures with excellent optical propertiesXiang Chen, Yaqing Zhang, Xinxin Yue, et al.ACS Nano|October 31, 2015
Strain Loading Mode Dependent Bandgap Deformation Potential in ZnO Micro/NanowiresXuewen Fu, Zhi-Min Liao, Ren Liu, et al.Nature Communications|July 2, 2025
Sacrifice-layer-free transfer of wafer-scale atomic-layer-deposited dielectrics and full-device stacks for two-dimensional electronicsYuyu He, Zunxian Lv, Zhaochao Liu, et al.Ultramicroscopy|September 3, 2019
Tunable electron beam pulser for picoseconds stroboscopic microscopy in transmission electron microscopesChunguang Jing, Yimei Zhu, Ao Liu, et al.Pageof 6