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Micron (Oxford, England : 1993)
|
January 10, 2015
Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review
A Drezet, Y Sonnefraud, A Cuche, et al.
Journal of Fluorescence
|
September 17, 2008
Self-assembly drives quantum dot photoluminescence
J Plain, Y Sonnefraud, P Viste, et al.
Physical Review Letters
|
November 5, 2004
Control of the refractive index in photopolymerizable materials for (2+1)D solitary wave guide formation
K D Dorkenoo, F Gillot, O Crégut, et al.
Nano Letters
|
November 9, 2017
Experimental Verification of Entanglement Generated in a Plasmonic System
F Dieleman, M S Tame, Y Sonnefraud, et al.
Nanotechnology
|
May 7, 2009
Fluorescent oxide nanoparticles adapted to active tips for near-field optics
A Cuche, B Masenelli, G Ledoux, et al.
Optics Express
|
March 16, 2012
Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films
D Y Lei, S Kéna-Cohen, B Zou, et al.
Optics Express
|
June 17, 2009
Near-field optical imaging with a CdSe single nanocrystal-based active tip
Y Sonnefraud, N Chevalier, J-F Motte, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 7) with videos related to
Sort By:
Page
of 1
Micron (Oxford, England : 1993)
|
January 10, 2015
Near-field microscopy with a scanning nitrogen-vacancy color center in a diamond nanocrystal: A brief review
A Drezet, Y Sonnefraud, A Cuche, et al.
Journal of Fluorescence
|
September 17, 2008
Self-assembly drives quantum dot photoluminescence
J Plain, Y Sonnefraud, P Viste, et al.
Physical Review Letters
|
November 5, 2004
Control of the refractive index in photopolymerizable materials for (2+1)D solitary wave guide formation
K D Dorkenoo, F Gillot, O Crégut, et al.
Nano Letters
|
November 9, 2017
Experimental Verification of Entanglement Generated in a Plasmonic System
F Dieleman, M S Tame, Y Sonnefraud, et al.
Nanotechnology
|
May 7, 2009
Fluorescent oxide nanoparticles adapted to active tips for near-field optics
A Cuche, B Masenelli, G Ledoux, et al.
Optics Express
|
March 16, 2012
Spectroscopic ellipsometry as an optical probe of strain evolution in ferroelectric thin films
D Y Lei, S Kéna-Cohen, B Zou, et al.
Optics Express
|
June 17, 2009
Near-field optical imaging with a CdSe single nanocrystal-based active tip
Y Sonnefraud, N Chevalier, J-F Motte, et al.
Page
of 1