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Y Weiland

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Journal of Microscopy|January 9, 2010
Model based precision structural measurements on barely resolved objectsD Baddeley, Y Weiland, C Batram, et al.
Journal of Microscopy|August 8, 2009
Using conventional fluorescent markers for far-field fluorescence localization nanoscopy allows resolution in the 10-nm rangeP Lemmer, M Gunkel, Y Weiland, et al.
Pageof 1

Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
Journal of Microscopy|January 9, 2010
Model based precision structural measurements on barely resolved objectsD Baddeley, Y Weiland, C Batram, et al.
Journal of Microscopy|August 8, 2009
Using conventional fluorescent markers for far-field fluorescence localization nanoscopy allows resolution in the 10-nm rangeP Lemmer, M Gunkel, Y Weiland, et al.
Pageof 1