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Optics Express|November 23, 2021
Unsupervised anomaly detection of MEMS in low illumination based on polarimetric Support Vector Data DescriptionYaokang Huang, Mei Sang, Lun Xing, et al.
Sensors (Basel, Switzerland)|December 11, 2022
Defect Detection of MEMS Based on Data Augmentation, WGAN-DIV-DC, and a YOLOv5 ModelZhenman Shi, Mei Sang, Yaokang Huang, et al.
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