Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Yaoping Hou

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Nanotechnology|March 30, 2021
Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopyWenting Wang, Kaidi Zhang, Wenhao Zhang, et al.
Ultramicroscopy|September 2, 2019
Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensingWeijie Zhang, Yuhang Chen, Yaoping Hou, et al.
Nanotechnology|May 24, 2019
Metasurface-enhanced optical lever sensitivity for atomic force microscopyZan Yao, Xicheng Xia, Yaoping Hou, et al.
Optics Letters|February 15, 2020
Efficient fabrication of a high-aspect-ratio AFM tip by one-step exposure of a long focal depth holographic femtosecond axilens beamDeng Pan, Shunli Liu, Shengyun Ji, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Nanotechnology|March 30, 2021
Multifunctional cantilevers for simultaneous enhancement of contact resonance and harmonic atomic force microscopyWenting Wang, Kaidi Zhang, Wenhao Zhang, et al.
Ultramicroscopy|September 2, 2019
Subsurface imaging of rigid particles buried in a polymer matrix based on atomic force microscopy mechanical sensingWeijie Zhang, Yuhang Chen, Yaoping Hou, et al.
Nanotechnology|May 24, 2019
Metasurface-enhanced optical lever sensitivity for atomic force microscopyZan Yao, Xicheng Xia, Yaoping Hou, et al.
Optics Letters|February 15, 2020
Efficient fabrication of a high-aspect-ratio AFM tip by one-step exposure of a long focal depth holographic femtosecond axilens beamDeng Pan, Shunli Liu, Shengyun Ji, et al.
Pageof 1