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Yasuhiro Sugawara

Showing results (1-10 of 56) with videos related to

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The Review of Scientific Instruments|April 4, 2023
Development of low-temperature and ultrahigh-vacuum photoinduced force microscopyTatsuya Yamamoto, Yasuhiro Sugawara
Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 27, 2023
Investigation of semiconductor properties of Co/Si(111)-7 × 7 by AFM/KPFSZhang Qu, Yasuhiro Sugawara, Yanjun Li
Beilstein Journal of Nanotechnology|August 12, 2022
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopyMasato Miyazaki, Yasuhiro Sugawara, Yan Jun Li
The Journal of Physical Chemistry Letters|August 14, 2020
Atomic Scale Three-Dimensional Au Nanocluster on a Rutile TiO<sub>2</sub> (110) Surface Resolved by Atomic Force MicroscopyYuuki Adachi, Yasuhiro Sugawara, Yan Jun Li
Langmuir : the ACS Journal of Surfaces and Colloids|August 26, 2021
Charge Behavior of Terminal Hydroxyl on Rutile TiO<sub>2</sub>(110)Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li
Nanomaterials (Basel, Switzerland)|August 6, 2020
Multi-Channel Exploration of O Adatom on TiO<sub>2</sub>(110) Surface by Scanning Probe MicroscopyHuan Fei Wen, Yasuhiro Sugawara, Yan Jun Li
Microscopy (Oxford, England)|November 1, 2014
Spin-selective Imaging by Magnetic Exchange Force Microscopy Using Ferromagnetic ResonanceYasuhiro Sugawara, Eiji Arima, Yoshitaka Naitoh, et al.
Beilstein Journal of Nanotechnology|February 10, 2023
High-low Kelvin probe force spectroscopy for measuring the interface state densityRyo Izumi, Masato Miyazaki, Yan Jun Li, et al.
The Review of Scientific Instruments|December 2, 2011
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter depositionYukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 22, 2017
Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopyEiji Arima, Yoshitaka Naitoh, Yan Jun Li, et al.
Pageof 6

Showing results (1-10 of 56) with videos related to

Sort By:
Pageof 6
The Review of Scientific Instruments|April 4, 2023
Development of low-temperature and ultrahigh-vacuum photoinduced force microscopyTatsuya Yamamoto, Yasuhiro Sugawara
Journal of Physics. Condensed Matter : an Institute of Physics Journal|February 27, 2023
Investigation of semiconductor properties of Co/Si(111)-7 × 7 by AFM/KPFSZhang Qu, Yasuhiro Sugawara, Yanjun Li
Beilstein Journal of Nanotechnology|August 12, 2022
Direct measurement of surface photovoltage by AC bias Kelvin probe force microscopyMasato Miyazaki, Yasuhiro Sugawara, Yan Jun Li
The Journal of Physical Chemistry Letters|August 14, 2020
Atomic Scale Three-Dimensional Au Nanocluster on a Rutile TiO<sub>2</sub> (110) Surface Resolved by Atomic Force MicroscopyYuuki Adachi, Yasuhiro Sugawara, Yan Jun Li
Langmuir : the ACS Journal of Surfaces and Colloids|August 26, 2021
Charge Behavior of Terminal Hydroxyl on Rutile TiO<sub>2</sub>(110)Masato Miyazaki, Yasuhiro Sugawara, Yan Jun Li
Nanomaterials (Basel, Switzerland)|August 6, 2020
Multi-Channel Exploration of O Adatom on TiO<sub>2</sub>(110) Surface by Scanning Probe MicroscopyHuan Fei Wen, Yasuhiro Sugawara, Yan Jun Li
Microscopy (Oxford, England)|November 1, 2014
Spin-selective Imaging by Magnetic Exchange Force Microscopy Using Ferromagnetic ResonanceYasuhiro Sugawara, Eiji Arima, Yoshitaka Naitoh, et al.
Beilstein Journal of Nanotechnology|February 10, 2023
High-low Kelvin probe force spectroscopy for measuring the interface state densityRyo Izumi, Masato Miyazaki, Yan Jun Li, et al.
The Review of Scientific Instruments|December 2, 2011
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter depositionYukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 22, 2017
Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopyEiji Arima, Yoshitaka Naitoh, Yan Jun Li, et al.
Pageof 6