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Yasuhiro Sugawara

Showing results (21-30 of 56) with videos related to

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Nanotechnology|June 11, 2009
The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surfaceYoshitaka Naitoh, Yukinori Kinoshita, Yan Jun Li, et al.
The Review of Scientific Instruments|October 27, 2016
Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forcesEiji Arima, Huanfei Wen, Yoshitaka Naitoh, et al.
Nanotechnology|October 5, 2017
Magnetic resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonatorYukinori Kinoshita, Yan Jun Li, Satoru Yoshimura, et al.
Journal of Public Health Management and Practice : JPHMP|August 24, 2017
Evacuation Decision Making and Expanded Roles of Adult Daycare Services in the Great East Japan Earthquake: Qualitative Analysis Using Semistructured InterviewsHiroko Mori, Yasuhiro Sugawara, Shuichi P Obuchi, et al.
Nanotechnology|May 2, 2013
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modesZong Min Ma, Lili Kou, Yoshitaka Naitoh, et al.
Nanotechnology|January 10, 2018
KPFM/AFM imaging on TiO<sub>2</sub>(110) surface in O<sub>2</sub> gasEiji Arima, Huan Fei Wen, Yoshitaka Naitoh, et al.
ACS Nano|December 29, 2023
Optical Imaging of a Single Molecule with Subnanometer Resolution by Photoinduced Force MicroscopyTatsuya Yamamoto, Hidemasa Yamane, Nobuhiko Yokoshi, et al.
Beilstein Journal of Nanotechnology|December 7, 2020
Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopyTatsuya Yamamoto, Ryo Izumi, Kazushi Miki, et al.
Nanotechnology|April 22, 2015
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedbackLili Kou, Zongmin Ma, Yan Jun Li, et al.
Ultramicroscopy|March 2, 2010
Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticityTatsuya Ogawa, Shinkichi Kurachi, Masami Kageshima, et al.
Pageof 6

Showing results (21-30 of 56) with videos related to

Sort By:
Pageof 6
Nanotechnology|June 11, 2009
The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surfaceYoshitaka Naitoh, Yukinori Kinoshita, Yan Jun Li, et al.
The Review of Scientific Instruments|October 27, 2016
Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forcesEiji Arima, Huanfei Wen, Yoshitaka Naitoh, et al.
Nanotechnology|October 5, 2017
Magnetic resonance force microscopy using ferromagnetic resonance of a magnetic tip excited by microwave transmission via a coaxial resonatorYukinori Kinoshita, Yan Jun Li, Satoru Yoshimura, et al.
Journal of Public Health Management and Practice : JPHMP|August 24, 2017
Evacuation Decision Making and Expanded Roles of Adult Daycare Services in the Great East Japan Earthquake: Qualitative Analysis Using Semistructured InterviewsHiroko Mori, Yasuhiro Sugawara, Shuichi P Obuchi, et al.
Nanotechnology|May 2, 2013
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modesZong Min Ma, Lili Kou, Yoshitaka Naitoh, et al.
Nanotechnology|January 10, 2018
KPFM/AFM imaging on TiO<sub>2</sub>(110) surface in O<sub>2</sub> gasEiji Arima, Huan Fei Wen, Yoshitaka Naitoh, et al.
ACS Nano|December 29, 2023
Optical Imaging of a Single Molecule with Subnanometer Resolution by Photoinduced Force MicroscopyTatsuya Yamamoto, Hidemasa Yamane, Nobuhiko Yokoshi, et al.
Beilstein Journal of Nanotechnology|December 7, 2020
Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopyTatsuya Yamamoto, Ryo Izumi, Kazushi Miki, et al.
Nanotechnology|April 22, 2015
Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedbackLili Kou, Zongmin Ma, Yan Jun Li, et al.
Ultramicroscopy|March 2, 2010
Step response measurement of AFM cantilever for analysis of frequency-resolved viscoelasticityTatsuya Ogawa, Shinkichi Kurachi, Masami Kageshima, et al.
Pageof 6