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Yena Kwon

Showing results (1-10 of 7) with videos related to

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Applied Microscopy|February 13, 2021
Method of Ga removal from a specimen on a microelectromechanical system-based chip for in-situ transmission electron microscopyYena Kwon, Byeong-Seon An, Yeon-Ju Shin, et al.
Scientific Reports|December 29, 2019
Amorphous Ta<sub>x</sub>Mn<sub>y</sub>O<sub>z</sub> Layer as a Diffusion Barrier for Advanced Copper InterconnectsByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
Microscopy Research and Technique|October 9, 2018
Quantification of crystallinity using zero-loss filtered electron diffractionByeong-Seon An, Yena Kwon, Hyun-Woo Cha, et al.
Applied Microscopy|February 13, 2021
Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam systemByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
ACS Applied Materials & Interfaces|December 18, 2019
Characteristics of an Amorphous Carbon Layer as a Diffusion Barrier for an Advanced Copper InterconnectByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
Micron (Oxford, England : 1993)|June 7, 2023
Measurement of dielectric function and bandgap of germanium telluride using monochromated electron energy-loss spectroscopyJin-Su Oh, Kyu-Jin Jo, Min-Chul Kang, et al.
Nanoscale|February 22, 2020
Rapid and mass-producible synthesis of high-crystallinity MoSe<sub>2</sub> nanosheets by ampoule-loaded chemical vapor depositionNa Liu, Woong Choi, Hyeongi Kim, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Applied Microscopy|February 13, 2021
Method of Ga removal from a specimen on a microelectromechanical system-based chip for in-situ transmission electron microscopyYena Kwon, Byeong-Seon An, Yeon-Ju Shin, et al.
Scientific Reports|December 29, 2019
Amorphous Ta<sub>x</sub>Mn<sub>y</sub>O<sub>z</sub> Layer as a Diffusion Barrier for Advanced Copper InterconnectsByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
Microscopy Research and Technique|October 9, 2018
Quantification of crystallinity using zero-loss filtered electron diffractionByeong-Seon An, Yena Kwon, Hyun-Woo Cha, et al.
Applied Microscopy|February 13, 2021
Evaluation of ion/electron beam induced deposition for electrical connection using a modern focused ion beam systemByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
ACS Applied Materials & Interfaces|December 18, 2019
Characteristics of an Amorphous Carbon Layer as a Diffusion Barrier for an Advanced Copper InterconnectByeong-Seon An, Yena Kwon, Jin-Su Oh, et al.
Micron (Oxford, England : 1993)|June 7, 2023
Measurement of dielectric function and bandgap of germanium telluride using monochromated electron energy-loss spectroscopyJin-Su Oh, Kyu-Jin Jo, Min-Chul Kang, et al.
Nanoscale|February 22, 2020
Rapid and mass-producible synthesis of high-crystallinity MoSe<sub>2</sub> nanosheets by ampoule-loaded chemical vapor depositionNa Liu, Woong Choi, Hyeongi Kim, et al.
Pageof 1