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Physical Review Letters|March 24, 2005
Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopyRomain Stomp, Yoichi Miyahara, Sacha Schaer, et al.
The Review of Scientific Instruments|August 23, 2024
Needle in a haystack: Efficiently finding atomically defined quantum dots for electrostatic force microscopyJosé Bustamante, Yoichi Miyahara, Logan Fairgrieve-Park, et al.
Nanotechnology|January 19, 2010
Cantilever-based sensing: the origin of surface stress and optimization strategiesMichel Godin, Vincent Tabard-Cossa, Yoichi Miyahara, et al.
Nano Letters|June 20, 2017
Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force MicroscopyAaron Mascaro, Zi Wang, Pierre Hovington, et al.
Nanotechnology|August 7, 2012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopyWilliam Paul, Yoichi Miyahara, Peter Grütter
The Journal of Physical Chemistry Letters|January 30, 2026
Probing Electrocatalytic Gas Evolution Reaction at Pt by Force Noise Measurements. Part 2. OxygenNataraju Bodappa, Gregory Jerkiewicz, Peter Grutter
The Review of Scientific Instruments|June 7, 2012
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environmentsAleksander Labuda, Kei Kobayashi, Yoichi Miyahara, et al.
Nanotechnology|November 29, 2012
Layer-by-layer growth of sodium chloride overlayers on an Fe(001)-p(1 × 1)O surfaceAntoni Tekiel, Jessica Topple, Yoichi Miyahara, et al.
Nanotechnology|February 27, 2026
Improving the electrical conductivity of Pt- nanowires deposited by focused electron beam induced deposition using thermal annealingRajendra Rai, Ujjwal Dhakal, Binod Dc, et al.
Nanotechnology|November 2, 2013
Transient adhesion and conductance phenomena in initial nanoscale mechanical contacts between dissimilar metalsWilliam Paul, David Oliver, Yoichi Miyahara, et al.
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