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Yoshitaka Naitoh

Showing results (1-10 of 22) with videos related to

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Chemical Communications (Cambridge, England)|February 20, 2007
Cross-coupling of alkyl halides with Grignard reagents using nickel and palladium complexes bearing eta(3)-allyl ligand as catalystsJun Terao, Yoshitaka Naitoh, Hitoshi Kuniyasu, et al.
The Review of Scientific Instruments|December 2, 2011
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter depositionYukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 22, 2017
Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopyEiji Arima, Yoshitaka Naitoh, Yan Jun Li, et al.
Microscopy (Oxford, England)|January 12, 2022
Study of high-low KPFM on a pn-patterned Si surfaceRyo Izumi, Yan Jun Li, Yoshitaka Naitoh, et al.
Microscopy (Oxford, England)|November 1, 2014
Spin-selective Imaging by Magnetic Exchange Force Microscopy Using Ferromagnetic ResonanceYasuhiro Sugawara, Eiji Arima, Yoshitaka Naitoh, et al.
Nanotechnology|November 19, 2016
Investigation of the surface potential of TiO<sub>2</sub> (110) by frequency-modulation Kelvin probe force microscopyLili Kou, Yan Jun Li, Takeshi Kamijyo, et al.
Nanotechnology|June 11, 2009
The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surfaceYoshitaka Naitoh, Yukinori Kinoshita, Yan Jun Li, et al.
The Review of Scientific Instruments|October 27, 2016
Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forcesEiji Arima, Huanfei Wen, Yoshitaka Naitoh, et al.
Nanotechnology|May 2, 2013
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modesZong Min Ma, Lili Kou, Yoshitaka Naitoh, et al.
Nanotechnology|January 10, 2018
KPFM/AFM imaging on TiO<sub>2</sub>(110) surface in O<sub>2</sub> gasEiji Arima, Huan Fei Wen, Yoshitaka Naitoh, et al.
Pageof 3

Showing results (1-10 of 22) with videos related to

Sort By:
Pageof 3
Chemical Communications (Cambridge, England)|February 20, 2007
Cross-coupling of alkyl halides with Grignard reagents using nickel and palladium complexes bearing eta(3)-allyl ligand as catalystsJun Terao, Yoshitaka Naitoh, Hitoshi Kuniyasu, et al.
The Review of Scientific Instruments|December 2, 2011
Fabrication of sharp tungsten-coated tip for atomic force microscopy by ion-beam sputter depositionYukinori Kinoshita, Yoshitaka Naitoh, Yan Jun Li, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|July 22, 2017
Separation of atomic-scale spin contrast on NiO(0 0 1) by magnetic resonance force microscopyEiji Arima, Yoshitaka Naitoh, Yan Jun Li, et al.
Microscopy (Oxford, England)|January 12, 2022
Study of high-low KPFM on a pn-patterned Si surfaceRyo Izumi, Yan Jun Li, Yoshitaka Naitoh, et al.
Microscopy (Oxford, England)|November 1, 2014
Spin-selective Imaging by Magnetic Exchange Force Microscopy Using Ferromagnetic ResonanceYasuhiro Sugawara, Eiji Arima, Yoshitaka Naitoh, et al.
Nanotechnology|November 19, 2016
Investigation of the surface potential of TiO<sub>2</sub> (110) by frequency-modulation Kelvin probe force microscopyLili Kou, Yan Jun Li, Takeshi Kamijyo, et al.
Nanotechnology|June 11, 2009
The influence of a Si cantilever tip with/without tungsten coating on noncontact atomic force microscopy imaging of a Ge(001) surfaceYoshitaka Naitoh, Yukinori Kinoshita, Yan Jun Li, et al.
The Review of Scientific Instruments|October 27, 2016
Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forcesEiji Arima, Huanfei Wen, Yoshitaka Naitoh, et al.
Nanotechnology|May 2, 2013
The stray capacitance effect in Kelvin probe force microscopy using FM, AM and heterodyne AM modesZong Min Ma, Lili Kou, Yoshitaka Naitoh, et al.
Nanotechnology|January 10, 2018
KPFM/AFM imaging on TiO<sub>2</sub>(110) surface in O<sub>2</sub> gasEiji Arima, Huan Fei Wen, Yoshitaka Naitoh, et al.
Pageof 3