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Micron (Oxford, England : 1993)|August 5, 2003
Comparison of detectability limits for elemental mapping by EF-TEM and STEM-XEDSMasashi Watanabe, David B Williams, Yoshitsugu Tomokiyo
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Strain analysis of Si by FEM and energy-filtering CBEDTetsuya Okuyama, Masaru Nakayama, Yoshitsugu Tomokiyo, et al.
Journal of Electron Microscopy|April 14, 2004
HRTEM image contrast and atomistic microstructures of long-period ordered Al-rich TiAl alloysSatoshi Hata, Kiyoshi Higuchi, Toshitsugu Mitate, et al.
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