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Applied Optics|November 19, 2016
Scanning deflectometric profiler for measurement of transparent parallel platesYouichi Bitou, Yohan KondoOptics Letters|May 19, 2009
Displacement metrology directly linked to a time standard using an optical-frequency-comb generatorYouichi BitouApplied Optics|April 9, 2005
Two-wavelength phase-shifting interferometry with a superimposed grating displayed on an electrically addressed spatial light modulatorYouichi BitouApplied Optics|June 21, 2002
One-way imaging through a polarization-sensitive aberrator by use of an optical lock-in detectionYouichi BitouOptics Letters|September 6, 2003
Digital phase-shifting interferometer with an electrically addressed liquid-crystal spatial light modulatorYouichi BitouApplied Optics|November 22, 2008
Closed-loop phase-shifting homodyne interferometry using heterodyne phase detectionYouichi BitouOptics Letters|August 19, 2008
Phase-shifting interferometry with feedback control using heterodyne phase detectionYouichi BitouOptics Express|June 6, 2019
Three-spherical-mirror test for radius of curvature measurement using a Fabry-Pérot cavityYouichi Bitou, Osamu Sato, Souichi TeladaOptics Express|June 9, 2009
Accurate wide-range displacement measurement using tunable diode laser and optical frequency comb generatorYouichi Bitou, Thomas R Schibli, Kaoru MinoshimaApplied Optics|September 16, 2005
Phase-shifting interferometry with equal phase steps by use of a frequency-tunable diode laser and a Fabry-Perot cavityYouichi Bitou, Hajime Inaba, Feng-Lei Hong, et al.Pageof 4