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Publishing Process Editorial Board Scope & Policies Peer Review FAQ Submit

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JoVE Journal Methods Collections JoVE Encyclopedia of Experiments Archive

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Youichi Bitou

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Applied Optics|February 24, 2011

Discontinuous surface measurement by wavelength-tuning interferometry with the excess fraction method correcting scanning nonlinearityKenichi Hibino, Yosuke Tani, Youichi Bitou, et al.

Applied Optics|June 30, 2006

Doppler-free spectroscopy using a continuous-wave optical frequency synthesizerHajime Inaba, Takeshi Ikegami, Feng-Lei Hong, et al.

Sensors (Basel, Switzerland)|February 10, 2021

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelYassir Arezki, Rong Su, Ville Heikkinen, et al.

Pageof 2

Search research articles

Showing results (11-20 of 13) with videos related to

Sort By:

Pageof 2

You have reached the last page of results.This site can display upto 13 results.

Applied Optics|February 24, 2011

Discontinuous surface measurement by wavelength-tuning interferometry with the excess fraction method correcting scanning nonlinearityKenichi Hibino, Yosuke Tani, Youichi Bitou, et al.

Applied Optics|June 30, 2006

Doppler-free spectroscopy using a continuous-wave optical frequency synthesizerHajime Inaba, Takeshi Ikegami, Feng-Lei Hong, et al.

Sensors (Basel, Switzerland)|February 10, 2021

Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer LevelYassir Arezki, Rong Su, Ville Heikkinen, et al.

Pageof 2