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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 15, 2022
O-Net: A Fast and Precise Deep-Learning Architecture for Computational Super-Resolved Phase-Modulated Optical MicroscopyShiraz S Kaderuppan, Wai Leong Eugene Wong, Anurag Sharma, et al.Journal of Neuroengineering and Rehabilitation|June 22, 2024
Enhancing fall risk assessment: instrumenting vision with deep learning during walksJason Moore, Robert Catena, Lisa Fournier, et al.International Journal of Neural Systems|April 22, 2025
Multimodal Integration of EEG and Near-Infrared Spectroscopy for Robust Cross-Frequency Coupling EstimationNicolás J Gallego-Molina, Andrés Ortiz, Francisco J Martínez-Murcia, et al.Sensors (Basel, Switzerland)|July 20, 2021
Automated Landslide-Risk Prediction Using Web GIS and Machine Learning ModelsNaruephorn Tengtrairat, Wai Lok Woo, Phetcharat Parathai, et al.Heliyon|January 6, 2025
Taguchi-based optimisation of FSW parameters for advancement in aerospace materials: Al-Li 2060 alloyNoah E El-Zathry, Stephen Akinlabi, Wai Lok Woo, et al.Sensors (Basel, Switzerland)|April 28, 2018
Unsupervised Learning for Monaural Source Separation Using Maximization⁻Minimization Algorithm with Time⁻Frequency DeconvolutionWai Lok Woo, Bin Gao, Ahmed Bouridane, et al.Cellular and Molecular Biology (Noisy-Le-Grand, France)|July 12, 2022
Leukocyte telomere length and lipid parameters in patients with myocardial infarction with non-obstructive coronary arteriesNihal Inandiklioglu, Vahit Demir, Yunus Celik, et al.Sensors (Basel, Switzerland)|August 9, 2020
Efficient Noisy Sound-Event Mixture Classification Using Adaptive-Sparse Complex-Valued Matrix Factorization and OvsO SVMPhetcharat Parathai, Naruephorn Tengtrairat, Wai Lok Woo, et al.Sensors (Basel, Switzerland)|January 20, 2021
Deep Temporal Convolution Network for Time Series ClassificationBee Hock David Koh, Chin Leng Peter Lim, Hasnae Rahimi, et al.IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|November 13, 2020
A Lightweight Spatial and Temporal Multi-Feature Fusion Network for Defect DetectionBozhen Hu, Bin Gao, Wai Lok Woo, et al.Pageof 22