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Yunzhu Yue

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Optics Express|July 2, 2026
Multi-mode interferometry for measuring the depth of deep silicon-etched microstructuresYunzhu Yue, Xingjian Jiang, Guannan Li, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Optics Express|July 2, 2026
Multi-mode interferometry for measuring the depth of deep silicon-etched microstructuresYunzhu Yue, Xingjian Jiang, Guannan Li, et al.
Pageof 1