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Microscopy (Oxford, England)|February 17, 2026
Development of dodecahedron type MCP detector for SEM toward full energy range and solid angle electron detectionYuto Yanagihara, Yuanzhao Yao, Kazuhiro Kumagai, et al.
Microscopy (Oxford, England)|July 16, 2025
Detection of low-energy backscattered electron in scanning electron microscopy using microchannel plate detectorYuto Yanagihara, Yuanzhao Yao, Hayata Yamamoto, et al.
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