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Journal of Applied Crystallography|June 29, 2017
X-ray topography of subsurface crystal layersZbigniew Swiatek, Igor Fodchuk, Ruslan Zaplitnyy
Journal of Applied Crystallography|June 29, 2017
Structure diagnostics of heterostructures and multi-layered systems by X-ray multiple diffractionMariana Borcha, Igor Fodchuk, Mykola Solodkyi, et al.
Micromachines|September 28, 2023
Fabrication and Characterization of Dielectric ZnCr<sub>2</sub>O<sub>4</sub> Nanopowders and Thin Films for Parallel-Plate Capacitor ApplicationsVasyl Mykhailovych, Gabriel Caruntu, Adrian Graur, et al.
Nanomaterials (Basel, Switzerland)|June 11, 2026
Donor Intra-Center Absorption to Resonant States in Quantum Wells: Analysis of Peak ShapesVolodymyr Akimov, Viktor Tulupenko, Roman Demediuk, et al.
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