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Ultramicroscopy|April 27, 2000
Surface structural sensitivity of convergent-beam RHEED: Si (0 0 1) 2 x 1 models compared with dynamical simulationsZuo, Weierstall, Peng, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 18, 2000
Transmission Electron Diffraction at 200 eV and Damage Thresholds below the Carbon K EdgeStevens, Chen, Weierstall, et al.Optics Express|May 28, 2009
Tomographic diffractive imaging of monolayer crystals at atomic resolution with onedimensional compact supportU Weierstall, J Spence, G HembreeNature Materials|November 22, 2005
Diffractive electron imaging of nanoparticles on a substrateJinsong Wu, U Weierstall, John C H SpenceMicroscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|January 21, 2003
Ordering energies and occupancies in doped TiAl, and dedicated ALCHEMI instrumentationJ C H Spence, N Jiang, U WeierstallPhilosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences|June 14, 2003
Phase recovery and lensless imaging by iterative methods in optical, X-ray and electron diffractionJ C H Spence, U Weierstall, M HowellsUltramicroscopy|September 29, 2004
Coherence and sampling requirements for diffractive imagingJ C H Spence, U Weierstall, M HowellsJournal of Synchrotron Radiation|October 25, 2014
Double-focusing mixing jet for XFEL study of chemical kineticsDingjie Wang, Uwe Weierstall, Lois Pollack, et al.Reports on Progress in Physics. Physical Society (Great Britain)|September 15, 2012
X-ray lasers for structural and dynamic biologyJ C H Spence, U Weierstall, H N ChapmanThe Review of Scientific Instruments|April 3, 2012
Injector for scattering measurements on fully solvated biospeciesU Weierstall, J C H Spence, R B DoakPageof 33,467