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ACS Applied Materials & Interfaces|July 21, 2015
Enhanced Antifouling Properties of Carbohydrate Coated Poly(ether sulfone) MembranesM Daniela Angione, Thomas Duff, Alan P Bell, et al.
ACS Applied Materials & Interfaces|July 17, 2015
Surface-Limited Synthesis of Pt Nanocluster Decorated Pd Hierarchical Structures with Enhanced Electrocatalytic Activity toward Oxygen Reduction ReactionTao Yang, Guojian Cao, Qingli Huang, et al.
ACS Applied Materials & Interfaces|July 27, 2016
Ni- and Mn-Promoted Mesoporous Co3O4: A Stable Bifunctional Catalyst with Surface-Structure-Dependent Activity for Oxygen Reduction Reaction and Oxygen Evolution ReactionWenqiao Song, Zheng Ren, Sheng-Yu Chen, et al.
ACS Applied Materials & Interfaces|July 27, 2016
Investigation of Ester- and Amide-Linker-Based Porous Organic Polymers for Carbon Dioxide Capture and Separation at Wide Temperatures and PressuresRuh Ullah, Mert Atilhan, Baraa Anaya, et al.
ACS Applied Materials & Interfaces|July 27, 2016
Capture and Reversible Storage of Volatile Iodine by Novel Conjugated Microporous Polymers Containing Thiophene UnitsXin Qian, Zhao-Qi Zhu, Han-Xue Sun, et al.
ACS Applied Materials & Interfaces|July 27, 2016
Tuning the Morphology and Crystal Structure of Li2O2: A Graphene Model Electrode Study for Li-O2 BatteryYao Yang, Tao Zhang, Xiaochen Wang, et al.
ACS Applied Materials & Interfaces|July 28, 2016
First-Principles Prediction of Ultralow Lattice Thermal Conductivity of Dumbbell Silicene: A Comparison with Low-Buckled SiliceneBo Peng, Hao Zhang, Hezhu Shao, et al.
ACS Applied Materials & Interfaces|July 28, 2016
Far Red/Near-Infrared AIE Dots for Image-Guided Photodynamic Cancer Cell AblationGuangxue Feng, Wenbo Wu, Shidang Xu, et al.
ACS Applied Materials & Interfaces|July 28, 2016
pH-Sensitive ZnO Quantum Dots-Doxorubicin Nanoparticles for Lung Cancer Targeted Drug DeliveryXiaoli Cai, Yanan Luo, Weiying Zhang, et al.
ACS Applied Materials & Interfaces|July 28, 2016
Quantification of Valleys of Randomly Textured Substrates as a Function of Opening Angle: Correlation to the Defect Density in Intrinsic nc-Si:HDo Yun Kim, Simon Hänni, Jan-Willem Schüttauf, et al.
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