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Advanced Structural and Chemical Imaging|June 23, 2018
Maximising the resolving power of the scanning tunneling microscopeLewys Jones, Shuqiu Wang, Xiao Hu, et al.
Advanced Structural and Chemical Imaging|July 11, 2017
Dynamic X-ray diffraction imaging of the ferroelectric response in bismuth ferriteNouamane Laanait, Wittawat Saenrang, Hua Zhou, et al.
Advanced Structural and Chemical Imaging|August 23, 2016
3D reconstruction of biological structures: automated procedures for alignment and reconstruction of multiple tilt series in electron tomographySébastien Phan, Daniela Boassa, Phuong Nguyen, et al.
Advanced Structural and Chemical Imaging|October 13, 2018
An open-source software ecosystem for the interactive exploration of ultrafast electron scattering dataLaurent P René de Cotret, Martin R Otto, Mark J Stern, et al.
Advanced Structural and Chemical Imaging|August 28, 2018
Multi-slice frozen phonon simulations of high-angle annular dark field scanning transmission electron microscopy images of the structurally and compositionally complex Mo-V-Nb-Te oxide catalystDouglas A Blom, Thomas Vogt
Advanced Structural and Chemical Imaging|November 7, 2017
Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticlesJacob Madsen, Pei Liu, Jakob B Wagner, et al.
Advanced Structural and Chemical Imaging|December 8, 2018
Protein structural biology using cell-free platform from wheat germIrina V Novikova, Noopur Sharma, Trevor Moser, et al.
Advanced Structural and Chemical Imaging|December 23, 2016
Automatic software correction of residual aberrations in reconstructed HRTEM exit waves of crystalline samplesColin Ophus, Haider I Rasool, Martin Linck, et al.
Advanced Structural and Chemical Imaging|July 16, 2019
Correction to: Accuracy of surface strain measurements from transmission electron microscopy images of nanoparticlesJacob Madsen, Pei Liu, Jakob B Wagner, et al.
Advanced Structural and Chemical Imaging|October 15, 2016
Structural damage reduction in protected gold clusters by electron diffraction methodsEduardo Ortega, Arturo Ponce, Ulises Santiago, et al.
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