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Applied optics

Showing results (1301-1310 of 50,909) with videos related to

Pageof 5,091
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Applied Optics|September 13, 2002
Amplitude and phase recovery of rotationally symmetric beamsDaniela Dragoman, Mircea Dragoman, Karl-Heinz Brenner
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluationDmitri Kouznetsov, Alfred Hofrichter, Bernard Drévillon
Applied Optics|August 3, 2002
Simultaneous measurement of surface geometry and material distribution by focusing ellipsotopometryUlrich Neuschaefer-Rube, Wolfgang Holzapfel
Applied Optics|August 3, 2002
Extended-range temporal electronic speckle pattern interferometryManuel Servin, Abundio Davila, Juan Antonio Quiroga
Applied Optics|August 3, 2002
Design of an interferometric system for the measurement of phasing errors in segmented mirrorsCaries Pizarro, Josep Arasa, Ferran Laguarta, et al.
Applied Optics|August 3, 2002
Thermally and electrically switchable gratings based on polymer-ball-type polymer-dispersed liquid-crystal filmsAndy Ying-Guey Fuh, Chia-Rong Lee, Ya-Hui Ho
Applied Optics|August 3, 2002
Highly efficient and aberration-corrected spectrometer for advanced Raman spectroscopyMasayuki Futamata, Takehiko Takenouchi, Kei-ichi Katakura
Applied Optics|August 3, 2002
Admittance diagrams of accidental and premeditated optical inhomogeneities in coatingsDaniel Poitras
Applied Optics|August 3, 2002
Extreme-ultraviolet calibration of thin-film Zr filters for the cosmic hot interstellar plasma spectrometerRichelieu Hemphill, Maria G Pelizzo, Mark Hurwitz
Applied Optics|August 15, 2003
Ordinary and extraordinary rays in gradient-index lensesDiana Tentori, Javier Camacho
Pageof 5,091

Showing results (1301-1310 of 50,909) with videos related to

Sort By:
Pageof 5,091
Applied Optics|September 13, 2002
Amplitude and phase recovery of rotationally symmetric beamsDaniela Dragoman, Mircea Dragoman, Karl-Heinz Brenner
Applied Optics|August 3, 2002
Direct numerical inversion method for kinetic ellipsometric data. I. Presentation of the method and numerical evaluationDmitri Kouznetsov, Alfred Hofrichter, Bernard Drévillon
Applied Optics|August 3, 2002
Simultaneous measurement of surface geometry and material distribution by focusing ellipsotopometryUlrich Neuschaefer-Rube, Wolfgang Holzapfel
Applied Optics|August 3, 2002
Extended-range temporal electronic speckle pattern interferometryManuel Servin, Abundio Davila, Juan Antonio Quiroga
Applied Optics|August 3, 2002
Design of an interferometric system for the measurement of phasing errors in segmented mirrorsCaries Pizarro, Josep Arasa, Ferran Laguarta, et al.
Applied Optics|August 3, 2002
Thermally and electrically switchable gratings based on polymer-ball-type polymer-dispersed liquid-crystal filmsAndy Ying-Guey Fuh, Chia-Rong Lee, Ya-Hui Ho
Applied Optics|August 3, 2002
Highly efficient and aberration-corrected spectrometer for advanced Raman spectroscopyMasayuki Futamata, Takehiko Takenouchi, Kei-ichi Katakura
Applied Optics|August 3, 2002
Admittance diagrams of accidental and premeditated optical inhomogeneities in coatingsDaniel Poitras
Applied Optics|August 3, 2002
Extreme-ultraviolet calibration of thin-film Zr filters for the cosmic hot interstellar plasma spectrometerRichelieu Hemphill, Maria G Pelizzo, Mark Hurwitz
Applied Optics|August 15, 2003
Ordinary and extraordinary rays in gradient-index lensesDiana Tentori, Javier Camacho
Pageof 5,091