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Applied Optics|September 9, 2020
Dielectric approximation media to reproduce dispersion for field transformationY Liu, S Tang, H Shi, et al.
Applied Optics|September 9, 2020
Polarization-sensitive transfer matrix modeling for displacement measuring interferometryAngus Bridges, Andrew Yacoot, Thomas Kissinger, et al.
Applied Optics|September 9, 2020
Measuring source width and transverse coherence length using Fresnel diffraction from a phase stepRasoul Aalipour, Mohammad Taghi Tavassoly, Ahad Saber
Applied Optics|September 9, 2020
Simulation and calibration of a compact millimeter-wavelength Fourier transform spectrometerMira Liu, Zhaodi Pan, Ritoban Basu Thakur, et al.
Applied Optics|September 9, 2020
Single-shot common-path off-axis dual-wavelength digital holographic microscopyManoj Kumar, Xiangyu Quan, Yasuhiro Awatsuji, et al.
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