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Applied Optics|March 10, 2006
Multiwavelength discrimination and measurements of a two-gas mixture by use of a broadly tunable mid-infrared semiconductor laserChuan Peng, Q Le Han, Rui Q Yang, et al.Applied Optics|March 17, 2006
Ultranarrow bandpass hybrid filter with wide rejection bandJulien Lumeau, Michel Cathelinaud, Jean Bittebierre, et al.Applied Optics|March 17, 2006
Microstructure-related properties at 193 nm of MgF2 and GdF3 films deposited by a resistive-heating boatMing-Chung Liu, Cheng-Chung Lee, Masaaki Kaneko, et al.Applied Optics|May 11, 2005
Fundamental characteristics of a synthesized light source for optical coherence tomographyManabu Sato, Ichiro Wakaki, Yuuki Watanabe, et al.Applied Optics|May 11, 2005
Monochromatic heterodyne fiber-optic profile sensor for spatially resolved velocity measurements with frequency division multiplexingThorsten Pfister, Lars Büttner, Katsuaki Shirai, et al.Applied Optics|May 11, 2005
Corrections of size-of-source effect and distance effect in radiometric measurements of radianceJuan Carlos Solorio-Leyva, José Guadalupe Suárez-Romero, José Germán Cortés-Reynoso, et al.Applied Optics|May 11, 2005
Crossed source-detector geometry for a novel spray diagnostic: Monte Carlo simulation and analytical resultsEdouard Berrocal, Dmitry Y Churmakov, Vadim P Romanov, et al.Applied Optics|May 11, 2005
Creation of line defects in holographic photonic crystals by a double-exposure thresholding methodChen Chang, Tzu-Min Yan, Hua-Kuang LiuApplied Optics|May 11, 2005
Bulk acousto-optic wavelength agile filter module for a wavelength-multiplexed optical scannerZahid Yaqoob, Nabeel A RizaApplied Optics|May 11, 2005
Normalized differential detection by use of smart pixels with smart illuminationDaryn E Benson, Jim M Murray, Robert D Regester, et al.Pageof 5,091